Tae-Hee Han
--------------------------------------------------- Defect Management for Metal Halide Perovskite Optoelectronic Devices Tae-Hee Han1 1 Division of Materials Science and Engineering, HanyangUniversity, Korea The family of metal halide perovskites have proven to be an excellent material for solar cells and light emitting diodes. Low temperature and solution-based fabrication process of perovskites are also big advantages for low-cost production. The solution processed metal halide perovskite films are polycrystalline in nature, and the polycrystalline perovskite thin films inevitably possesses many grain boundaries with structural disorders and traps.The crystalline defects and grain boundaries in the polycrystalline thin films have significant impact on both optoelectronic properties of photoactive materialsand stability of the perovskite thin film and devices. Furthermore, the defective surface and grain boundaries are vulnerable against environmental species such as oxygen and moisture, which results in poor operational stability of the solar cells and light-emitting diodes. Here, we present the management strategiesof grains surface and grain boundaries in perovskite thin film by manipulating crystalnucleation and growth of solution-processed perovskite thin film. The effective mitigation of such defective grain boundaries results in significantly reduced charged trap densities, environmental stability, and ion migration of the perovskite thinfilm, showing much improved operational stability in solar cells and light-emitting diodes. |